The Atomic Force Microscope (AFM) is being used to solve processing and materials problems in a wide range of technologies affecting the electronics, telecommunications, biomedical, chemical, automotive, aerospace, and energy industries AFM images show critical information about surface features with unprecedented clarity. The AFM can examine any rigid surface, either in air or with the specimen immersed in a liquid. "Minor" (and major) differences between "smooth" surfaces are shown dramatically. On one hand, the AFM can resolve very tiny features, even single atoms, that were previously unseen. On the other hand, the AFM can examine a field of view larger than 125 microns (0.005 inch), so that you can make comparisons with other information, e.g. features seen in the light microscope or hazes seen by eye.

The graph above was generated from data acquired on an atomic force microscope. The molecule titan is stretched and the force vs. distance is plotted. From points A to B the molecule appears to follow Hook's law (F=kd), just like a spring. The linear function of distance for force fails in region B to C. Finally the protein is uncoiled domain by domain in region C to D.

Simulation [slow; wait for download] of atomic force microscropy using a refrigerator magnet. Other related demonstrations.